Agilent Nano Indenter G200
Features and benefits
• Award-winning, high-speed Express Testoption compatible with all G200
indentation DCMII and XP heads, and stages.
• Simple determination of indenter areafunction and frame stiffness.
• Accurate, repeatable results compliantwith ISO 14577 standard.
• Electromagnetic actuation allowsunparalleled dynamic range in force and
• Conigurable for optimized routine testingor new applications.
• Modular options for imaging scratch,high-temperature, and dynamic testing.
• Outstanding software with real-timeexperimental control, easy test protocol
development, and precision driftcompensation.
• Semiconductor,thin films, MEMs (wafer applications)
• Hard coatings, DLC films
• Composite materials, fibers, polymers
• Metals, ceramics
• Lead-free solder
• Biomaterials, biological and artificialtissue
The Nano Indenter G200
Cross profile topography plot
3D graph from Survy Scan
点击下载：附件--纳米压痕仪 G200 操作规程.docx