MultiMode Scanning ProbeMicroscope
| Equipment Introduction 设备简介|
The Multi-Mode scanning probe microscope (Fig. 1)
is designed for imaging small (approximately 15mm diameter) samples using a series of interchangeable scanners. Itis able to provideimages of features varying in size from the atomic scale to more than 125µm.
|Application Examples 应用实例|
|Atomic Force Microscopy(AFM) basic imaging mode (Fig.2)|
No.1 Contact AFM Mode:
Contact mode AFM operates by scanning a tip attached to the end of a cantilever across the sample surface while monitoring the change in cantilever def ection with a split photodiode detector.
No.2 Tapping Mode AFM：
Tapping Mode AFM operates by scannin-g a tip attached to the end of an oscillating cantilever cross the sample surface.
Scan Asyst is the world’s first imaging mode with aut-omatic image optimization technology for AFM.
|Atomic Force Microscopy(AFM) Segmentation imaging mode|
No.4 Scanning Tunneling Microscopy (STM) (Fig.3)：
STM relies on aprecise scanning technique to produce very high-resolution, three-dimensionalimages of sample surfaces.
No.5 Electric Force Microscopy (EFM)(Fig.4) ：
EFM measuresvariations in the electric field gradient above a sample.
No.6 Piezoresponse Atomic Force Microscopy (PFM)(Fig.5):
To perform abasic Piezoresponse measurement, place theperiodically poled lithium niobate sample on thesample chuck of the Dimension microscope.
No.7 Conductive AFM (CAFM) (Fig.6):
CAFM performs avariety of measurements, which can Detect current intensity from pA to uA .
No.8 Magnetic Force Microscopy (MFM)(Fig.7)：
In MFM, atapping cantilever equipped with a special tip first scans ove-r the surface ofthe sample to observe magnetic domains.
We can observebiological specimens in their natural, fluid environments, and make real timeobservations of samples undergoing electrochemical reactions (ECAFM).
No.10 Surface Modification Techniques (Fig.9):
Nanolithography,Nanoindentation, Nanoscratching, Nanomanipulation.